With atomic force microscopy, tiny structures can be imaged. But usually there is a trade of: In order to create pictures quickly, very stiff materials have to be used in the microscope, but they can damage delicate structures such as living cells. Scientists at TU Wien (Vienna) have now found a way around this dilemma.
Atomic force microscopy: New sensing element for high-speed imaging
- EurekAlert
- 5. 3 2020 (06:00)